Participants and visitors at the forthcoming Hong Kong Jewellery & Watch Fair are being invited by the Gemological Institute of America (GIA) Alumni Association to attend its GemFest Hong Kong 2008, during the event. The GemFest is slated to take place on September 19 at the Hong Kong Convention and Exhibition Centre in Room 601. At the GemFest, Dr. James Shigley, GIA Distinguished Research Fellow will deliver a presentation on how GIA scientists collect and analyse samples from known geographic sources to support the Institute's country-of-origin reports and build an ever-expanding database of gemological information on coloured gemstones. He will also narrate his recent expedition to gem mining sites in Tanzania. A question and answer session will follow, featuring Shigley and Kenneth Scarratt, managing director, Southeast Asia and director, GIA Research, Thailand.

GIA has arranged for all the GIA alumni who attend this event, to be given six Carat Points. The Carat Point System of Recognition is an award system that bestows points for GIA Alumni-approved career-enhancing activities and then permanently records them. Carat Point values are awarded to GIA Alumni Association members who participate in approved activities such as attending GIA Alumni and professional events; becoming a chapter officer; reading and acknowledging select articles from Gems & Gemology, The Loupe: GIA World News, GIA Insider and successfully completing the G&G challenge.

GIA has arranged the event to be a free attendance.